OLED & TP AOI
OLED LLO AOI
OLED LLO AOI provides high precise detection on particle defects occurring during OLED Laser lift-off process. Defects occurring within or on the film could be all accurately inspected by OLED AOI. Inspection defects including scratches, residue, FM…etc.
TP AOI - before cutting
Touch Panel AOI(before cutting) provides high precise inspection on large-size panel of touch panel before panel cutting process. Inspection defects including ITO jumper , metal trace, scratch…etc.
Cover Glass AOI
Cover Glass AOI is designed to resolve appearance defects on small-sized cover glass such as smart phone, Pad..etc., enabling to conduct inspection in In-line or Off-line mode. Inspection defects including scratch, dents, ITO jumper…etc.
Multi-dimensional inspection system
Multi-dimensional inspection system is a customized AOI system, providing multi-dimensional surfaces inspection on products with customized mechanism design and lighting source according to customers' needs. Inspection defects including scratch, saw, bright dot, white dot, ink...etc.
