Other Series
AOM
The Line Scan CCD is applied to achieve superior speed and full board metrology, supporting instant L/S and measurement analysis.
CWV
CWV consists of various laser lighting with distinct laser energy which enhances quick foreign materials removal and repair.
AI Auto Image Capture Machine
AI Auto Image Capture Machine is specialized with AI deep learning function to intelligently proceed defect classification analysis, providing precise defect recognition and decrease overkill rate, which could effectively reduce labor cost and enhance producing quality of IC substrate.
AOI VRS
AOI VRS incorporates 2D Code function for fast and accurate defect data reading ; high illumination LED light further assures productivity and efficiency.
Verification Station
VS 08 and VS 09 provides high speed defect review function, with the user-friendly operation design, inspection data can be directly showed on display. VS 08 and VS 09 could automatically receive analysis data form AFVI systems that could effectively enhance inspecting benefit.
Ink Marking
Ink Marking system provides defects inspection and auto-marking functions to automatically conduct marking on NG products which is controlled by PC programme.
