Utechzone’s “fine line wafer AOI with patented fluorescent illumination” is approved to be applicable for CoWoS, RDL, Interposer inspection and even more process under photolithography. With years of operation, UT’s wafer AOI has accomplished the milestone to successfully inspect more than a million wafers in multiple plants. We are delighted to announce this significant achievement that is done by a domestic AOI maker with all investors, customers and stakeholders.